Ключевые слова: HTS, YBCO, thin films, substrate LaAlO3, melting, surface, overheating, modeling, thermal stability
Puig T., Celentano G., Palau A., Obradors X., Mestres N., Ricart S., Sotgiu G., Pop C., Piperno L., Ternero P., Alcalа J.
Ключевые слова: HTS, YBCO, films, chemical solution deposition, heat treatment, precursors, substrate LaAlO3, spin coating process, fabrication, microstructure, X-ray diffraction, magnetization, critical temperature, critical current density, critical caracteristics, Jc/B curves, temperature dependence, experimental results
Antonov A.V., Ikonnikov A.V., Masterov D.V., Mikhaylov A.N., Morozov S.V., N.Nozdrin Y., Pavlov S.A., Parafin A.E., Tetel’baum D.I., Ustavschikov S.S., Vasiliev V.K., Yunin P.A., Savinov D.A.
Ключевые слова: HTS, GdBCO, fibers, phase formation, fluorine process, TFA-MOD process, substrate LaAlO3, fabrication, X-ray diffraction, microstructure
Ключевые слова: HTS, YBCO, thin films, substrate LaAlO3, chemical solution deposition, fabrication, multilayered structures, magnetron sputtering, protection layer Ag, protection layer Au, interfaces, critical caracteristics, critical current density, heat treatment, microstructure, Raman spectroscopy, experimental results
Holzapfel B., Hanisch J., Nast R., Driessche I.V., Erbe M., Cayado P., Rijckaert H., Buysser K.D., Sierra J.D., Dominguez P.L.
Ключевые слова: chemical solution deposition, inkjet printing, HTS, YBCO, nanocomposites, substrate LaAlO3, thin films, nanodoping, critical caracteristics, critical current density, thickness dependence, X-ray diffraction, microstructure, angular dependence, Jc/B curves, magnetic field dependence, pinning force, fabrication, experimental results
Galluzzi V., Mancini A., Puig T., Celentano G., Palau A., Obradors X., Bartolome E., Augieri A., Pompeo N., Silva E., Torokhtii K., Alimenti A.
Ключевые слова: HTS, YBCO, films epitaxial, PLD process, chemical solution deposition, substrate LaAlO3, nanoscaled effects, anisotropy, impedance, angular dependence, magnetic field dependence, measurement technique, defects, nanorods, twin boundaries, nanoparticles, pinning mechanism, flux flow resistance, comparison
Ключевые слова: HTS, YBCO, thin films, fabrication, MOD process, fluorine-free process, sintering, precursors, substrate LaAlO3, X-ray diffraction, microstructure, resistance, temperature dependence
Puig T., Obradors X., Gazquez J., Guzman R., Mundet B., Valvidares S.M., Pellegrin E., Bartolomeм E., Herrero-Martнn J.
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